The Dimension Laboratory provides traceability to the international definition of the metre through a gauge block interferometer. This instrument, which uses two lasers calibrated by iodine-stabilized He-Ne laser, provides EMI with the capability of measuring various artifacts, either directly or indirectly, as listed below.

 

End Standards

According to ISO 3650, the reference grade gauge blocks (grade K) are calibrated by interferometry. With frequency stabilized lasers coupled to a Twyman-Green interferometer designed by the National Physical Laboratory, United Kingdom, the laboratory is able to provide the following services:

Gauge Length

Material

Parameter

Calibration and Measurement Capability (CMC)

0.5 mm to 100 mm

Steel, Tungsten carbide and Ceramic

Central length deviation

Q[25 nm, 0.7×10-6 L]

 100 mm to 300 mm  Steel, Tungsten carbide and Ceramic  Central length deviation  Q[37 nm, 0.7×10-6 L]

 

Gauge blocks of lower grades (grade 0, 1 and 2) are calibrated by comparison with EMI reference gauge blocks. Using this method, the following services are available:

Gauge Length

Material

Parameter

CMC

0.5 mm to 100 mm

Steel

Central length deviation

Q[80 nm, 1.1×10-6 L]

0.5 mm to 100 mm

Ceramic

Central length deviation

Q[80 nm, 1.93×10-6 L]

 

Diameter Standards
Diameter standards such as plug and ring gauges (including GO and NO-GO) are calibrated by comparative measurements using reference gauge blocks or reference ring gauges as standards by Universal Length Measuring Machine (ULM). In this category, the following services are provided by the laboratory:

Artifacts

Range

Parameter

CMC

Internal diameter gauges

10 mm to 50 mm

Diameter

0.7 μm

External diameter gauges

1 to 80 mm

Diameter

0.8 μm

 

By ULM, the following services can be provided by the laboratory:

Artifacts

Range

CMC

Dial Gauges

Up to 50 mm (resolution 0.001mm)

2 μm

 Dial Gauges  50 mm to 100 mm (resolution 0.001mm)  3 μm

External micrometers (comparing with ceramic gauge block)

0mm to 25 mm (resolution 0.001mm)

2 μm

External micrometers

25mm to 75mm (resolution 0.001mm)

2 μm

External micrometers

75mm to 175mm (resolution 0.001mm)

3 μm

Long gauge blocks

125 mm to 500 mm

Q[0.16 μm, 1.9×10-6 L

Form

The following form parameters can be measured by the laboratory:

Artifacts

Range

CMC

Optical flats and parallels

(maximum diameter 50 mm)

Flatness

0.05 μm

Universal Length Measuring machine (ULM)

0 mm to 100 mm

Q[0.062 μm, 1.3×10-6 L]

 

Gauge block comparator

0.5 mm to 100 mm

0.05

Angle indicating instruments

Up to 90° (resolution 0.01°)

0.02°

Angle gauges

Up to 90°

0.6"

Height gauges (analog and digital)

Up to 600 mm

(Resolution: 0.01 mm)

(0.011 mm + 9×10-6 L)

 

Caliper (vernier and digital)

Up to 600 mm

(Resolution : 0.01 mm)

(0.012 mm + 13×10-6 L)

 

 

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